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- Article name
- Method of reliability control PIN-photodiodes on voltage-current characteristics
- Authors
- Kondratenko V. S., , precisetech@mail.ru; ond491@yandex.ru, Moscow State University of Engineering and Computer Science, 20 Stromynka str., Moscow, 107996, Russia
Kuroedov A. V., , precisetech@mail.ru; ond491@yandex.ru, Moscow State University of Engineering and Computer Science, 20 Stromynka str., Moscow, 107996, Russia
Ryzhikov I. V., , precisetech@mail.ru; ond491@yandex.ru, Moscow State University of Engineering and Computer Science, 20 Stromynka str., Moscow, 107996, Russia
- Keywords
- the "ideal" and "nonideal" PIN-photodiode / a security ring / parametrical refusal voltage-current characteristic / m- and n-parameters / diagnostics / reliability
- Year
- 2010 Issue 2 Pages 67 - 73
- Code EDN
- Code DOI
- Abstract
- The diagnostic method PIN-photodiodes with security rings, based on the analysis voltage-current characteristic and differential m- and n-parameters, was developed for establishing of degradation mechanisms in lifetime test and the control of reliability ideal and nonideal photodiodes with defects, bringing parametrical refusal.
- Text
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