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- Article name
- Features of synthesis of thin films Bi-Nd-Fe-O on (0001)Al2O3 substrate by using the Bi0.95Nd0.05FeO3 target gas discharge dispersion method
- Authors
- SARICHEV D. A., , 108@ip.rsu.ru, South Federal University; Research Institute of Physics, Rostov-on-Don, Russia
RAZUMOVSKAYA O. N., , , Research Institute of Physics, Southern Federal University, Rostov-on-Don, Russia
Zinchenko S. P., , tres-3@mail.ru, Southern Scientific Center, Russian Academy of Sciences, 41 Chekhov av., Rostov-on-Don, 344006, Russia
PONOMARENKO V. O., , berserk2007@yandex.ru, Southern federal University, Rostov-on-Don, Russia
KOVTUN A. P., , kovtun.ap@mail.ru, Southern Scientific Center of RAS, Rostov-on-Don, Russia
TOLMACHOV G. N., , tolm@ip.rsu.ru, Southern Scientific Center of RAS, Rostov-on-Don, Russia
PLYAKA P. S., , pavstef@mail.ru, Southern Scientific Center, Russian Academy of Science, Rostov-on-Don, Russia
RAZNOMAZOV V. M., , ayda_mixalich@mail.ru, Scientific Institute of Physics, Southern Federal University, Rostov-on-Don, Russia
REZNICHENKO L. A., , raznomazov_vm@mail.ru, Scientific Institute of Physics, Southern Federal University, Rostov-on-Don, Russia
KONSTANTINOV G. M., , eks_rostov@bk.ru, Expert-criminality service, Regional department of customs administration, Rostov-on-Don, Russia
SIMONENKO S. A., , , Expert-criminality service, Regional department of customs administration, Rostov-on-Don, Russia
- Keywords
- BiFeO3 / thin films deposition / ceramic targets / high-frequency sputtering in plasma / elemental composition of thin films / total x-ray reflection fluorescence analysis / refraction and the absorption indexes / thin films x-ray diffraction investigation / thin films atomic force microscopy / thin films thickness investigation
- Year
- 2009 Issue 4 Pages 44 - 55
- Code EDN
- Code DOI
- Abstract
- The thin films Bi-Nd-Fe-O3 on the facet (0001)Al2O3 are fabricated using HF-sputtering of the ceramic target Bi0.95Nd0.05FeO3. Using EDAX DX-95 x-ray fluorescence spectrometer and spectrometer RFS-001 based on the total x-ray reflection of primary radiation qualitative agreement of elemental compositions of the deposited films with the sputtered target was demonstrated. The high dispersion of the refraction and the absorption indexes in the visible wave length range was revealed. X-ray structural analysis (DRCP-7), atomic-force microscopy data on PSD-function (maximum ~ 10 nm) and film thickness data obtained via visible wave length range reflection dependence on angle allow one to regard the phase of films as amorphous.
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