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- Article name
- Semiconductor noise thermometer
- Authors
- KHOLKIN V. U., , vkholkin@mail.ru, North-West State Technical University by Correspondence, Saint-Petersburg, Russia
- Keywords
- nois thermometer / semiconductor thermometer / functional electronics / low-frequency noise / semiconductor device
- Year
- 2009 Issue 2 Pages 85 - 89
- Code EDN
- Code DOI
- Abstract
- Possibility of creation of device, which allows to determine a temperature in the crystal's body of semiconductor microcircuit is examined. Principle of work of device is based on the effect of generation of noise in the direct branch of p-n-transition at the certain electric loadings.
- Text
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