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- Article name
- Temperature dependence of resistance of thick-film resistors in view of conducting phase particles segregation
- Authors
- KARAEV A. K., , , The All-Russia State Tax Academy of the Ministry of Finance of the Russian Federation, Moscow, Russia
- Keywords
- Year
- 2006 Issue 4 Pages 212 - 215
- Code EDN
- Code DOI
- Abstract
- It is considered three-dimensional (3D) lattice model (the sizes 50x50x50) for imitation of microstructure of thick-film resistors. Calculation of temperature dependence of resistance of thick-film resistors in view of various values of segregation factor is lead. In calculations the segregation factor accepted values 3; 4; 5; 6. It is shown that the increase in value of segregation factor is a similar increase of volume fraction of a conducting phase particles.
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