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- Article name
- Optical properties of bismuth ferrite multiferroic films determined by spectroscopic ellipsometry
- Authors
- PAVLENKO A. V., , antvpr@mail.ru, Research Institute of Physics Southern Federal University; Federal Research Center Southern Scientific Center of the RAS, Rostov-on-Don, Russia
ZHIDEL K. M., , karinagidele@gmail.com, Research Institute of Physics Southern Federal University, Rostov-on-Don, Russia
MATYASH Ya. Yu., , matyash.ya.yu@gmail.com, Federal Research Center Southern Scientific Center of the Russian Academy of Sciences, Rostov-on-Don, Russia
STRYUKOV D. V., , strdl@mail.ru, Federal Research Center Southern Scientific Center of the Russian Academy of Sciences, Rostov-on-Don, Russia
- Keywords
- thin films / multiferroic / optical properties / spectral ellipsometry / bismuth ferrite
- Year
- 2022 Issue 3 Pages 47 - 51
- Code EDN
- MZLKQK
- Code DOI
- 10.52190/2073-2562_2022_3_47
- Abstract
- The results of a study of the structure and optical properties for the BiFeO3/SrTiO3 heterostructure grown by RF cathode sputtering in an oxygen atmosphere on Al2O3(0001) substrates are presented. To interpret the ellipsometric spectra, taking into account the data of XRD and AFM, an optical model with an interface damaged layer was used. Good agreement between the experimental and theoretical spectra confirms the applicability of the chosen model and makes it possible to reliably determine the parameters of the layers. The results obtained will be useful for introducing such materials into integrated optical devices.
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