To obtain access to full text of journal and articles you must register!
- Article name
- Effect of thermal aging on the defect structure and dielectric properties of PbZr0.5Ti0.5O3 solid solution
- Authors
- REZNICHENKO L. A., , lareznichenko@sfedu.ru, Research Institute of Physics, Southern Federal University, Rostov-on-Don, Russia
ANDRYUSHIN K. P., , kpandryushin@gmail.com, Research Institute of Physics, Southern Federal University; Integrated Research Institute named after H. I. Ibragimov RAS, Rostov-on-Don, Russia; Grozny, Russia
ANDRYUSHINA I. N., , inandryushina@sfedu.ru, Research Institute of Physics Southern Federal University, Rostov-on-Don, Russia
- Keywords
- solid solution / PZT / thermal cycling / Curie-Weiss temperature / dielectric constant / degree of blurring
- Year
- 2024 Issue 2 Pages 36 - 39
- Code EDN
- ATJUKN
- Code DOI
- 10.52190/2073-2562_2024_2_36
- Abstract
- The article presents the results of a study on the effect of thermal cycling on the dielectric properties of the PbZr0.5Ti0.5O3 ceramic solid solution. It was found that thermally induced fatigue does not affect the Curie temperature, and the smearing parameter (γ) is close to ~1.47 at small numbers of cycles (N), increasing slightly with increasing N. The observed effects are explained by the interaction of different defect types. Conclusion for possible practical applications are presented.
- Text
- BUY for read the full text of article
- Buy
- 500.00 rub
