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- Article name
- Investigation of the CdZnTe structural perfection by the transmission electron microscopy
- Authors
- Denisov I. A., , labr7@giredmet.ru, JSC Giredmet, the Federal State Research and Design Institute of Rare Metal Industry, 5, Build. 1, B. Tolmachevski per., Moscow, 119017, Russia
Smirnova N. A., , labr7@giredmet.ru, JSC Giredmet, the Federal State Research and Design Institute of Rare Metal Industry, 5, Build. 1, B. Tolmachevski per., Moscow, 119017, Russia
Andrusov Yu. B., , labr7@giredmet.ru, JSC Giredmet, the Federal State Research and Design Institute of Rare Metal Industry, 5, Build. 1, B. Tolmachevski per., Moscow, 119017, Russia
Resnik V. Ya., , labr7@giredmet.ru, JSC Giredmet, the Federal State Research and Design Institute of Rare Metal Industry, 5, Build. 1, B. Tolmachevski per., Moscow, 119017, Russia
Mezhennyi M. V., , labr7@giredmet.ru, JSC Giredmet, the Federal State Research and Design Institute of Rare Metal Industry, 5, Build. 1, B. Tolmachevski per., Moscow, 119017, Russia
- Keywords
- CZT / transmission electron microscopy / nanoprecipitates / epitaxial structure
- Year
- 2011 Issue 5 Pages 35 - 40
- Code EDN
- Code DOI
- Abstract
- Features of defect generation in CZT wafers before and after heat treatment were analyzed using methods of transmission electron microscopy. It was shown that during wafers annealing corresponding to epitaxial structure production conditions there were not marked changes in density and average dimension of as grown precipitates which can be divided into three dimensional groups. Small nanoprecipitates (1.5-3.0 nm) correspond to areas which coherent conjugate with CZT matrix and save sequence of lattice atomic planes. Such formations are the areas with heightened Te atoms concentration which represent first stage of nanosize Te precipitates generation.
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