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- Article name
- Results of the study to sensitivity photocell matrix HgCdTe photodetector in different warm-up mode
- Authors
- Kremis I. I., , igor21738@ngs.ru, Novosibirsk Branch of the Institute of Semiconductor Physics, Siberian Branch of the Russian Academy of Sciences, Technological Design Institute of Applied Microelectronics, 2/1, Academican Lavrentev av., Novosibirsk, 630090, Russia
- Keywords
- elements fault / non-sensitive
- Year
- 2010 Issue 4 Pages 91 - 99
- Code EDN
- Code DOI
- Abstract
- The presented results of the study to sensitivity photocell matrix photodetector device production Sofradir, Institute of Semiconductor Physics and Orion Research-And-Production Association at passing photodetector new cycles frost from 293 K before 77 K. Is considered dependencies to sensitivity element from the temperature absolutely black body. Estimation of the frequency of the appearances fault is given on sensitivity element at miscellaneous temperature absolutely black body and frequentative cycles frost photodetector. The offered algorithm of the finding fault on receiver element sensitivity. The operating range of the lengths of the waves under investigation receiver corresponds to distant infrared area 8-14 mkm.
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